Sahin, O.Guder, H. S.Uzun, O.Sahin, E.Sopicka-Lizer, M.Gocmez, H.Artunc, E.2024-09-182024-09-1820150587-42461898-794Xhttps://doi.org/10.12693/APhysPolA.128.B-355https://hdl.handle.net/20.500.12483/13060International Conference on Computational and Experimental Science and Engineering (ICCESEN) -- OCT 25-29, 2014 -- Antalya, TURKEYBoth pressureless-sintered and dense, fine-grained silicon nitride ceramics were produced from mechanochemically activated nitride-based precursors. Scanning Electron Microscopy (SEM), Transmition Electron Microscopy (TEM), X-Ray Diffraction (XRD) and an ultra-low load microhardness tester were used to characterize these ceramics. Depth-sensing indentation (DSI) tests in the range of 200-1800 mN were performed on the silicon nitride ceramic to determine dynamic hardness (H-d) and reduced elastic modulus (E-r) values. These values were deduced by analyzing the unloading segments of the DSI curves. It was found that both H-d and E-r exhibits a significant indentation load dependence. Nix-Gao (NG) model was used to analyze the dynamic hardness data in the calculation of the load independent hardness value.eninfo:eu-repo/semantics/openAccessSialon CeramicsHardnessLoadNanoceramicsFabricationPrecursorsModulusPowderConference Object1282BB355B35910.12693/APhysPolA.128.B-3552-s2.0-84947749021Q3WOS:000363011700104Q4