Kundeyi, KadriyeAylikci, Nuray KupTirasoglu, EnginKahoul, AbdelhalimAylikci, Volkan2024-09-182024-09-182017978-0-7354-1483-90094-243Xhttps://doi.org/10.1063/1.4976359https://hdl.handle.net/20.500.12483/1294232nd International Physics Congress of Turkish-Physical-Society (TPS) -- SEP 06-09, 2016 -- Bodrum, TURKEYThe semi-empirical determination of natural widths of K alpha X-ray lines (K alpha 1 and K alpha 2) were performed for Si), Sb, Te, I, Ba, La, Ce, Pr, Nd, Sm, Eu, Gd and Tb. For the semi-empirical determination of the line widths, K shell fluorescence yields of elements were measured. The samples were excited by 59.5 keV gamma rays from a (241)A m annular radioactive source in order to measure the K shell fluorescence yields. The emitted K X-rays from the samples were counted by an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The measured K shell fluorescence yields were used for the calculation of K shell level widths. Finally, the natural widths of K X-ray lines were determined as the sums of levels which involved in the transition. The obtained values were compared with earlier studies.eninfo:eu-repo/semantics/closedAccess3d Transition-MetalsSpectraConference Object181510.1063/1.49763592-s2.0-85016007467Q4WOS:000435205100015N/A