Nekkab, M.Kahoul, A.Deghfel, B.Aylikci, N. KupAylikci, V.2024-09-182024-09-182015978-0-7354-1295-80094-243Xhttps://doi.org/10.1063/1.4914268https://hdl.handle.net/20.500.12483/106654th International Congress in Advances in Applied Physics and Materials Science (APMAS) -- APR 24-27, 2014 -- Fethiye, TURKEYThe analytical methods based on X-ray fluorescence are advantageous for practical applications in a variety of fields including atomic physics, X-ray fluorescence surface chemical analysis and medical research and so the accurate fluorescence yields (omega(K)) are required for these applications. In this contribution we report a new parameters for calculation of K-shell fluorescence yields (omega(K)) of elements in the range of 11 <= Z <= 30. The experimental data are interpolated by using the famous analytical function (omega(K)/(1-omega(K)))(1/q) (were q=3, 3.5 and 4) vs Z to deduce the empirical K-shell fluorescence yields. A comparison is made between the results of the procedures followed here and those theoretical and other semi-empirical fluorescence yield values. Reasonable agreement was typically obtained between our result and other works.eninfo:eu-repo/semantics/openAccessInner-shell ionization processK-shell fluorescence yieldsCalculation of K-Shell Fluorescence Yields for Low-Z ElementsConference Object165310.1063/1.49142682-s2.0-85063820803Q4WOS:000362294100077N/A