Growth and characterization of Fe-doped CuO/ZnO binary oxide thin films for possible optoelectronic applications

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dc.contributor.authorSogan, Serra
dc.contributor.authorYucel, Ersin
dc.contributor.authorSarikaya, Ebru Karakas
dc.contributor.authorKahveci, Osman
dc.contributor.authorAydin, Rasit
dc.contributor.authorAkkaya, Abdullah
dc.contributor.authorSahin, Buenyamin
dc.date.accessioned2024-09-18T20:20:04Z
dc.date.available2024-09-18T20:20:04Z
dc.date.issued2024
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractNanoscale binary oxide thin film structures of pristine and Fe-substituted CuO/ZnO have been produced on sodalime glass substrates by the SILAR method and characterized by different acceptable analytical approaches. The more irregular and lumpy ZnO in the pristine CuO/ZnO binary thin film sample evolved into more regular and hexagonal prismatic structures with the addition of Fe. XRD patterns of the samples indicated that both monoclinic CuO and hexagonal ZnO phases were present without any impurities. Optical analyses by meaning absorbance and transmittance measurements exhibit an important change in the energy band gap and transmittance value with the Fe doping ratio. The energy band edges of the bare sample shift to red with increasing Fe percentage in the starting solution, presumably due to an increase in the carrier concentration. The transfer length method (TLM) is used to define the conductivity properties of the samples, which considers the contact properties and structural features of thin films. The minimum specific contact resistivity of 0.865 x 10 6 Omega square was obtained by 3.0 % Fe-implemented CuO/ZnO binary oxide samples, and the addition of Fe increased the effective transfer length of thin films.en_US
dc.identifier.doi10.1016/j.optmat.2024.115557
dc.identifier.issn0925-3467
dc.identifier.issn1873-1252
dc.identifier.scopus2-s2.0-85193751961en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.urihttps://doi.org/10.1016/j.optmat.2024.115557
dc.identifier.urihttps://hdl.handle.net/20.500.12483/10038
dc.identifier.volume152en_US
dc.identifier.wosWOS:001231944500001en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofOptical Materialsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectFe-dopingen_US
dc.subjectBandgapen_US
dc.subjectResistivityen_US
dc.subjectComposite filmen_US
dc.subjectBinary oxidesen_US
dc.titleGrowth and characterization of Fe-doped CuO/ZnO binary oxide thin films for possible optoelectronic applicationsen_US
dc.typeArticleen_US

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