Preparation and Characterization of Zn x Cu(1-x)O Composite Films on Glass Substrates Through SILAR Processing
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Date
2015
Journal Title
Journal ISSN
Volume Title
Publisher
Springer
Access Rights
info:eu-repo/semantics/closedAccess
Abstract
CuO composite thin films with and without Zn-doping are deposited onto glass substrates by the SILAR method. All the films are characterized by scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), UV-Vis spectrophotometry, temperature dependent dc conductivity, and X-ray diffraction (XRD) measurements. SEM results show that the particle size decreases from 27 to 16 nm with increasing Zn-doping. EDX analysis evidences the amount of Zn in CuO films, which increases with increasing Zn concentration in the growth solutions. Transmittance, optical band gap, and activation energy values of the films are found to be increasing from the UV-Vis and temperature dependent dc conductivity measurements with increasing Zn-doping. It also is found from the XRD patterns that mean crystallite size of the films decreases from 18.94 to 13.70 nm with increasing Zn-doping. Moreover, increase in Zn concentration results peak shifts to lower 2 theta values. (C) The Minerals, Metals & Materials Society and ASM International 2015
Description
Keywords
Enhanced Photocatalytic Activity, Cuo Thin-Films, Band-Gap, Temperature, Nanofibers, Growth, Layer, Dye
Journal or Series
Metallurgical and Materials Transactions A-Physical Metallurgy and Materials Science
WoS Q Value
Q1
Scopus Q Value
Q1
Volume
46A
Issue
7
