Characterization of CBD grown ZnO films with high c-axis orientation

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dc.authoridKahraman, suleyman/0000-0002-7730-6353
dc.authoridBayansal, Fatih/0000-0001-9600-007X
dc.contributor.authorKahraman, S.
dc.contributor.authorBayansal, F.
dc.contributor.authorCetinkara, H. A.
dc.contributor.authorCakmak, H. M.
dc.contributor.authorGuder, H. S.
dc.date.accessioned2024-09-18T20:33:06Z
dc.date.available2024-09-18T20:33:06Z
dc.date.issued2012
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractHighly c-axis oriented ZnO films were deposited on seeded glass substrates. Successive ionic layer adsorption and reaction (SILAR) method and chemical bath deposition (CBD) method were used to obtain seed layers and ZnO films. To see the effects of seed layer and deposition time, structural (e.g. grain size, microstrain and dislocation density), morphological, and electrical (e.g. resistivity, activation energy) properties of the films were investigated by scanning electron microscopy, X-ray diffraction, and four point probe method. From the SEM images, resultant structures were found as well defined nanorods nearly perpendicular to the substrate surfaces and densely cover the substrates. The XRD patterns showed that ZnO films have hexagonal wurtzite structure with a preferred c-axis orientation along (002) plane. C-axis orientation was also supported by texture coefficient calculations. The lattice parameters of the structures were determined as a = 3.2268 angstrom, b = 5.2745 angstrom, alpha = beta = 90 degrees and gamma = 120 degrees. From the XRD patterns, it was revealed that, microstrain and dislocation density values of the structures decreased whereas grain size increased. This was attributed to enhancement occurred in lattice structure of the ZnO films. Activation energy values of the films were found in between 0.12 and 0.15 eV from the dark electrical resistivity-temperature characteristics in a temperature range of 300-500 K. (c) 2012 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipScientific Research Commission of Mustafa Kemal University [1001 M 0115]en_US
dc.description.sponsorshipThis work was supported by Scientific Research Commission of Mustafa Kemal University (Project No: 1001 M 0115).en_US
dc.identifier.doi10.1016/j.matchemphys.2012.03.108
dc.identifier.endpage1041en_US
dc.identifier.issn0254-0584
dc.identifier.issue2-3en_US
dc.identifier.scopus2-s2.0-84861531589en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage1036en_US
dc.identifier.urihttps://doi.org/10.1016/j.matchemphys.2012.03.108
dc.identifier.urihttps://hdl.handle.net/20.500.12483/11305
dc.identifier.volume134en_US
dc.identifier.wosWOS:000305918200070en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevier Science Saen_US
dc.relation.ispartofMaterials Chemistry and Physicsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectNanostructuresen_US
dc.subjectChemical synthesisen_US
dc.subjectPrecipitationen_US
dc.subjectElectrical propertiesen_US
dc.titleCharacterization of CBD grown ZnO films with high c-axis orientationen_US
dc.typeArticleen_US

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