Electronic structure study of the bimetallic Cu1-xZnx alloy thin films

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dc.authoridOZDEMIR, RASIM/0000-0003-1439-0444
dc.authoridMirzaei, Mahmoud/0000-0001-9346-4901
dc.authoridCengiz, Erhan/0000-0002-4094-5784
dc.contributor.authorOzkendir, O. Murat
dc.contributor.authorCengiz, Erhan
dc.contributor.authorMirzaei, Mahmoud
dc.contributor.authorKarahan, I. Hakki
dc.contributor.authorOzdemir, Rasim
dc.contributor.authorKlysubun, Wantana
dc.date.accessioned2024-09-18T19:52:37Z
dc.date.available2024-09-18T19:52:37Z
dc.date.issued2018
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractA series of Zn doped copper materials were investigated upon their crystal and electronic structure with the general formula Cu1-xZnx. CuZn alloys were produced via electrodeposition method. Galvanostatic deposition was preferred for the deposition. Crystal properties of the samples were studied via X-ray diffraction (XRD) patterns and supported by the X-ray absorption fine structure spectroscopy (XAFS) data. According to the crystal structure analysis, crystal geometries of the substituted samples were mainly determined in bcc cubic. The study has revealed that, low amount of Zn substitution (0.1M) are inactive in the molecular interplays and treated as an impurity in fcc copper environment. However, higher Zn concentrations (> 0.1 M) have built bcc structure under the influence of the highly overlapped 4p levels wavefunctions of the neighbouring Cu and Zn atoms. Thus, 0.1 M zinc substitution has been determined as a threshold of the phase transition from fcc to the bcc structure.en_US
dc.identifier.doi10.1080/10667857.2017.1391932
dc.identifier.endpage197en_US
dc.identifier.issn1066-7857
dc.identifier.issn1753-5557
dc.identifier.issue3en_US
dc.identifier.scopus2-s2.0-85032370134en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage193en_US
dc.identifier.urihttps://doi.org/10.1080/10667857.2017.1391932
dc.identifier.urihttps://hdl.handle.net/20.500.12483/7562
dc.identifier.volume33en_US
dc.identifier.wosWOS:000428679000002en_US
dc.identifier.wosqualityQ3en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherTaylor & Francis Ltden_US
dc.relation.ispartofMaterials Technologyen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectAlloysen_US
dc.subjectelectronic structureen_US
dc.subjectabsorption spectroscopyen_US
dc.subjectcrystal structureen_US
dc.titleElectronic structure study of the bimetallic Cu1-xZnx alloy thin filmsen_US
dc.typeArticleen_US

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