Radicle emergence test predicts longevity (half viability period, p50) of leek seed lots

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dc.authoridOzden, Eren/0000-0001-7507-9815
dc.authoridDEMIR, IBRAHIM/0000-0003-4515-0689
dc.authoridMavi, Kazim/0000-0003-0195-8539
dc.contributor.authorOzden, E.
dc.contributor.authorMavi, K.
dc.contributor.authorSari, E.
dc.contributor.authorDemir, I.
dc.date.accessioned2024-09-18T21:06:34Z
dc.date.available2024-09-18T21:06:34Z
dc.date.issued2017
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractThis study was carried out to test whether a single radicle emergence count (RE) can be used for predicting longevity in leek seed lots. Experiments were carried out on eight commercial leek seed lots with normal germination percentages above 75%. Single radicle emergence counts (2 mm) were performed after 120 hours of germination (20 degrees C, dark, between papers). Seed longevity was determined by hermetic storage at 45 degrees C with 20% seed moisture content over 96 'hours. Twelve subsamples were taken out of controlled storage after 8, 16, 24, 32, 40, 48, 56, 64, 72, 80, 88 and 96 hours and seed survival curves were constructed on radicle germination tests. Half viability period, p(50), was calculated for each lot. The RE percentages in leek seed lots ranged between 75 and 94% after 120 hours, while p(50) values ranged from 25.9 to 77.4 hours. Regression between RE of 120 hours and p(50) was found to be highly significant (R-2 = 0.848, P < 0.01). Thus, single radicle emergence counts (120 hours) could be used as an assessment of seed longevity in leek.en_US
dc.identifier.doi10.15258/sst.2017.45.1.06
dc.identifier.endpage247en_US
dc.identifier.issn0251-0952
dc.identifier.issn1819-5717
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-85019693635en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage243en_US
dc.identifier.urihttps://doi.org/10.15258/sst.2017.45.1.06
dc.identifier.urihttps://hdl.handle.net/20.500.12483/13702
dc.identifier.volume45en_US
dc.identifier.wosWOS:000401497800021en_US
dc.identifier.wosqualityQ3en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherIsta-Int Seed Testing Assocen_US
dc.relation.ispartofSeed Science and Technologyen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectMean Germination Timeen_US
dc.subjectVigoren_US
dc.titleRadicle emergence test predicts longevity (half viability period, p50) of leek seed lotsen_US
dc.typeArticleen_US

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