Facile fabrication and characterization of SnxCu(1-x)O composite films by the SILAR method on glass substrates

dc.authoridSahin, Bunyamin/0000-0001-7059-0315
dc.authoridBayansal, Fatih/0000-0001-9600-007X
dc.contributor.authorBayansal, F.
dc.contributor.authorYuksel, M.
dc.contributor.authorSahin, B.
dc.date.accessioned2024-09-18T20:11:41Z
dc.date.available2024-09-18T20:11:41Z
dc.date.issued2016
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractCuO composite thin films with Sn-doping are deposited on glass substrates by the SILAR method. All the films are characterized by metallurgical microscopy, scanning electron microscopy, energy dispersive Xray spectroscopy, X-ray diffraction, UV-Vis. spectroscopy and Raman spectroscopy. Metallurgical microscopy and scanning electron microscopy results revealed that homogeneity of the film surface distorts and particle size decreases from 110 to 43 nm with increasing Sn-doping. Energy dispersive X-ray spectroscopy evidences the amount of Sn in CuO films, which increases with increasing Sn concentration in the growth solutions. X-ray diffraction patterns showed that the mean crystallite size of the films is decreasing from similar to 14 to similar to 9 nm with increasing Sn-doping. Moreover, increase in Sn concentration results new peaks belong to SnO2 phases. UV-Vis. analysis showed that the transmittance and optical band-gap energy values of the films are increasing with increasing Sn-doping. Raman spectrum was also confirmed the phase formation of CuO nanostructures and it was seen that the Sn-doping caused shifts in Raman active modes. (c) 2015 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipScientific Research Commission of Mustafa Kemal University [12662]en_US
dc.description.sponsorshipThe authors gratefully acknowledge the financial support of the Scientific Research Commission of Mustafa Kemal University (Project No: 12662). The authors are also grateful to Dr. Osman Sahin from Mustafa Kemal University, Faculty of Arts and Sciences, Department of Physics for technical assistance in the metallurgical microscope investigations.en_US
dc.identifier.doi10.1016/j.jallcom.2015.12.174
dc.identifier.endpage44en_US
dc.identifier.issn0925-8388
dc.identifier.issn1873-4669
dc.identifier.scopus2-s2.0-84952895372en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage38en_US
dc.identifier.urihttps://doi.org/10.1016/j.jallcom.2015.12.174
dc.identifier.urihttps://hdl.handle.net/20.500.12483/9015
dc.identifier.volume664en_US
dc.identifier.wosWOS:000369061700006en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevier Science Saen_US
dc.relation.ispartofJournal of Alloys and Compoundsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectComposite materialsen_US
dc.subjectMetal oxidesen_US
dc.subjectNanostructured thin filmsen_US
dc.subjectRaman spectroscopyen_US
dc.subjectCuOen_US
dc.subjectSn-dopingen_US
dc.titleFacile fabrication and characterization of SnxCu(1-x)O composite films by the SILAR method on glass substratesen_US
dc.typeArticleen_US

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