Determination of Natural Line Widths of K? X-ray Lines for Some Elements in the Atomic Range 50?Z?65 at 59.5 keV

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Küçük Resim

Tarih

2017

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

Amer Inst Physics

Erişim Hakkı

info:eu-repo/semantics/closedAccess

Özet

The semi-empirical determination of natural widths of K alpha X-ray lines (K alpha 1 and K alpha 2) were performed for Si), Sb, Te, I, Ba, La, Ce, Pr, Nd, Sm, Eu, Gd and Tb. For the semi-empirical determination of the line widths, K shell fluorescence yields of elements were measured. The samples were excited by 59.5 keV gamma rays from a (241)A m annular radioactive source in order to measure the K shell fluorescence yields. The emitted K X-rays from the samples were counted by an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The measured K shell fluorescence yields were used for the calculation of K shell level widths. Finally, the natural widths of K X-ray lines were determined as the sums of levels which involved in the transition. The obtained values were compared with earlier studies.

Açıklama

32nd International Physics Congress of Turkish-Physical-Society (TPS) -- SEP 06-09, 2016 -- Bodrum, TURKEY

Anahtar Kelimeler

3d Transition-Metals, Spectra

Kaynak

Proceedings of The Turkish Physical Society 32nd International Physics Congress (Tps32)

WoS Q Değeri

N/A

Scopus Q Değeri

Q4

Cilt

1815

Sayı

Künye