Effects of thermal oxidation temperature on vacuum evaporated tin dioxide film

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dc.authoridKahraman, suleyman/0000-0002-7730-6353
dc.authoridBayansal, Fatih/0000-0001-9600-007X
dc.contributor.authorCakmak, H. M.
dc.contributor.authorCetinkara, H. A.
dc.contributor.authorKahraman, S.
dc.contributor.authorBayansal, F.
dc.contributor.authorTepe, M.
dc.contributor.authorGuder, H. S.
dc.contributor.authorCipiloglu, M. A.
dc.date.accessioned2024-09-18T20:57:07Z
dc.date.available2024-09-18T20:57:07Z
dc.date.issued2012
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractIn order to investigate the effect of thermal oxidation temperature on tin dioxide (SnO2), tin dioxide films were obtained on quartz substrates by vacuum evaporation of tin metal. The films were characterized by X-ray diffraction (XRD) analyses, scanning electron microscopy (SEM), temperature dependent electrical resistivity measurement and optical absorption spectroscopy. The SEM images showed that the films are dense, continuous and are composed of nanoparticles and particle sizes are increased after thermal oxidation. From the X-ray measurement results, the films indicated two strong reflection peaks of tetragonal structure in the orientations of (101) and (200) at 20 = 33.8 degrees and 37.95 degrees, respectively. Intensity of the peaks increased with increasing thermal oxidation temperature. We found resistivity values of about 10(-4) Omega-cm. Optical absorption spectra of the films in the UV-Vis spectral range revealed that optical band gap (E-g) value of the films increases with increasing thermal oxidation temperature. (C) 2012 Elsevier Ltd. All rights reserved.en_US
dc.description.sponsorshipScientific Research Commission of Mustafa Kemal University [1001 M 0115]en_US
dc.description.sponsorshipThis work was supported by Scientific Research Commission of Mustafa Kemal University (Project No: 1001 M 0115).en_US
dc.identifier.doi10.1016/j.spmi.2012.01.006
dc.identifier.endpage429en_US
dc.identifier.issn0749-6036
dc.identifier.issue3en_US
dc.identifier.scopus2-s2.0-84857360735en_US
dc.identifier.scopusqualityN/Aen_US
dc.identifier.startpage421en_US
dc.identifier.urihttps://doi.org/10.1016/j.spmi.2012.01.006
dc.identifier.urihttps://hdl.handle.net/20.500.12483/12293
dc.identifier.volume51en_US
dc.identifier.wosWOS:000301765700013en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherAcademic Press Ltd- Elsevier Science Ltden_US
dc.relation.ispartofSuperlattices and Microstructuresen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSnO2en_US
dc.subjectThermal evaporationen_US
dc.subjectThermal oxidationen_US
dc.titleEffects of thermal oxidation temperature on vacuum evaporated tin dioxide filmen_US
dc.typeArticleen_US

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