Surface roughness prediction in SILAR coating process of ZnO thin films: Mathematical modelling and validation

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dc.authoridYucel, Yasin/0000-0002-8572-4213
dc.contributor.authorYucel, Yasin
dc.contributor.authorOtuzbir, Omer
dc.contributor.authorYucel, Ersin
dc.date.accessioned2024-09-18T21:01:37Z
dc.date.available2024-09-18T21:01:37Z
dc.date.issued2023
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractThis study aimed to evaluate the effect of SILAR coating parameters on the surface roughness of ZnO thin films with a chemometric approach and to develop a mathematical model that can be used to predict the surface roughness of the films depending on the coating parameters. The selected process parameters for the SILAR coating of ZnO are the ammonia solution amount, cycle number and stirring speed. The effect of coating pa-rameters on ZnO thin film roughness was investigated with the help of RSM. A statistical estimation model was developed and used to estimate the effect of parameters on roughness. The adequacy of the developed mathe-matical model was tested with ANOVA. When the data obtained were examined, it was understood that the amount of NH4OH played a decisive role in the morphology of ZnO coatings. The surface roughness of the optimized coating was measured as 213.4 nm for Rq and 177.8 nm for Ra, and the developed mathematical models estimated the surface roughness of the coating as 214.9 nm for Rq and 179.6 nm for Ra. The findings revealed that the mathematical models developed to predict the surface roughness of ZnO films are accurate and reliable in predicting the Rq and Ra values.en_US
dc.description.sponsorshipHatay Mustafa Kemal University Research Foun-dation [19]en_US
dc.description.sponsorshipAcknowledgements The authors thank Hatay Mustafa Kemal University Research Foun-dation (Project No. 19.YL.049) for providing financial support for this project.en_US
dc.identifier.doi10.1016/j.mtcomm.2022.105101
dc.identifier.issn2352-4928
dc.identifier.scopus2-s2.0-85143878630en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.urihttps://doi.org/10.1016/j.mtcomm.2022.105101
dc.identifier.urihttps://hdl.handle.net/20.500.12483/12886
dc.identifier.volume34en_US
dc.identifier.wosWOS:000990059200001en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofMaterials Today Communicationsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectZnO thin filmen_US
dc.subjectSurface roughnessen_US
dc.subjectSILARen_US
dc.subjectCentral composite designen_US
dc.subjectResponse surface methodologyen_US
dc.subjectValidationen_US
dc.titleSurface roughness prediction in SILAR coating process of ZnO thin films: Mathematical modelling and validationen_US
dc.typeArticleen_US

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