Bandgap variation of nanostructure tin doped CdO films via SILAR processing

Basit Öğe Kaydı
dc.authoridBayansal, Fatih/0000-0001-9600-007X
dc.authoridSahin, Bunyamin/0000-0001-7059-0315
dc.contributor.authorSahin, B.
dc.contributor.authorTaskopru, T.
dc.contributor.authorBayansal, F.
dc.date.accessioned2024-09-18T20:25:29Z
dc.date.available2024-09-18T20:25:29Z
dc.date.issued2014
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractFive series of pure and tin-doped CdO films have been grown on amorphous glass substrates by the successive ionic layer adsorption and reaction (SILAR) method. The film's structural, morphological and optical properties have been investigated by X-ray diffraction (XRD), field emission scanning electron microscope (FESEM) and UV-vis spectrophotometer. XRD results showed that all of the films are polycrystalline cubic CdO. Doping of tin enhances the film's (111) preferred orientation and causes slight shift in the (111) Bragg angle towards higher value. From the FESEM images, it was seen that tin-doping concentration affects the shapes of the nanostructures. It was found that the tin-doping concentration modify the microstructures. With UV-vis analysis at the room temperature it was seen that the optical band gap and transmission properties of the films change with increasing tin concentration in the growth bath. (C) 2014 Elsevier Ltd and Techna Group S.r.l. All rights reserved.en_US
dc.description.sponsorshipScientific Research Commission of Mustafa Kemal University [374]en_US
dc.description.sponsorshipThis work is partially supported by the Scientific Research Commission of Mustafa Kemal University (Project no.: 374).en_US
dc.identifier.doi10.1016/j.ceramint.2014.01.089
dc.identifier.endpage8714en_US
dc.identifier.issn0272-8842
dc.identifier.issn1873-3956
dc.identifier.issue6en_US
dc.identifier.scopus2-s2.0-84897126821en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage8709en_US
dc.identifier.urihttps://doi.org/10.1016/j.ceramint.2014.01.089
dc.identifier.urihttps://hdl.handle.net/20.500.12483/10327
dc.identifier.volume40en_US
dc.identifier.wosWOS:000335201800132en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevier Sci Ltden_US
dc.relation.ispartofCeramics Internationalen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectGrain sizeen_US
dc.subjectX-ray methodsen_US
dc.subjectOptical propertiesen_US
dc.subjectCdOen_US
dc.titleBandgap variation of nanostructure tin doped CdO films via SILAR processingen_US
dc.typeArticleen_US

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