Investigation of the X-ray fluorescence parameters and valance electronic structure for Ni in Ni-B/hBN coating materials with doped TMAB and saccharine

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dc.contributor.authorKöksal, Oğuz Kağan
dc.contributor.authorKarahan, İsmail Hakkı
dc.date.accessioned2024-09-19T16:28:14Z
dc.date.available2024-09-19T16:28:14Z
dc.date.issued2022
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractIn this investigation, K shell valance electronic structure of Ni in Ni-B alloy coatings were studied by means of collecting the X-ray emission and XRD spectra. The data obtained were evaluated in terms of the K beta/K alpha X-ray intensity ratios and XRD data. The coated alloys were fabricated with using different concentrations of hexagonal boron nitride (hBN) for this study by electrochemical storage method. Besides saccharine and trimethylamine borane complex (TMAB) were added the current samples at constant concentration. The current specimens were excited by 59.5 keV photons from a 241Am annular radioactive source. K shell X-rays emitted by the specimens were detected by means of an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The K shell X-ray intensity ratios of Ni-B alloys are checked with pure Ni. Variations in the current outcomes were interpreted by the variation in valence electronic structures of Ni in Ni-B/hBN coating materials with doped TMAB and saccharine.en_US
dc.identifier.endpage97en_US
dc.identifier.issn2146-538X
dc.identifier.issueIOCENS’21 Konferansı Ek Sayısıen_US
dc.identifier.startpage89en_US
dc.identifier.trdizinid1192491en_US
dc.identifier.urihttps://search.trdizin.gov.tr/tr/yayin/detay/1192491
dc.identifier.urihttps://hdl.handle.net/20.500.12483/16611
dc.indekslendigikaynakTR-Dizinen_US
dc.language.isoenen_US
dc.relation.ispartofGümüşhane Üniversitesi Fen Bilimleri Dergisien_US
dc.relation.publicationcategoryMakale - Ulusal Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectIntensity ratioen_US
dc.subjectK shellen_US
dc.subjectXRDen_US
dc.subjectXRFen_US
dc.subjectValance electronic structureen_US
dc.titleInvestigation of the X-ray fluorescence parameters and valance electronic structure for Ni in Ni-B/hBN coating materials with doped TMAB and saccharineen_US
dc.typeArticleen_US

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