Photoelectron, Compton and characteristic x-ray escape from an HPGe Detector in the range 8-52 keV
Yükleniyor...
Tarih
2004
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
John Wiley and Sons Ltd
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba, and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities. Copyright © 2004 John Wiley & Sons, Ltd.
Açıklama
Anahtar Kelimeler
Energy dissipation, Germanium compounds, Photons, X ray detectors, X ray photoelectron spectroscopy, Characteristic x rays, COMPTON, Compton scattered photons, Energy, Energy depositions, Energy source, HPGe detectors, Possible mechanisms, Spectra's, Spectral feature, Photoelectrons
Kaynak
X-Ray Spectrometry
WoS Q Değeri
Scopus Q Değeri
Q3
Cilt
33
Sayı
6
