Photoelectron, Compton and characteristic x-ray escape from an HPGe Detector in the range 8-52 keV
dc.authorscopusid | 55914867700 | |
dc.authorscopusid | 7005079514 | |
dc.contributor.author | Yilmaz, Ercan | |
dc.contributor.author | Can, Cüneyt | |
dc.date.accessioned | 2024-09-19T15:48:44Z | |
dc.date.available | 2024-09-19T15:48:44Z | |
dc.date.issued | 2004 | |
dc.department | Hatay Mustafa Kemal Üniversitesi | en_US |
dc.description.abstract | Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba, and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities. Copyright © 2004 John Wiley & Sons, Ltd. | en_US |
dc.identifier.doi | 10.1002/xrs.746 | |
dc.identifier.endpage | 446 | en_US |
dc.identifier.issn | 0049-8246 | |
dc.identifier.issue | 6 | en_US |
dc.identifier.scopus | 2-s2.0-9444270336 | en_US |
dc.identifier.scopusquality | Q3 | en_US |
dc.identifier.startpage | 439 | en_US |
dc.identifier.uri | https://doi.org/10.1002/xrs.746 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12483/15278 | |
dc.identifier.volume | 33 | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.language.iso | en | en_US |
dc.publisher | John Wiley and Sons Ltd | en_US |
dc.relation.ispartof | X-Ray Spectrometry | en_US |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | Energy dissipation | en_US |
dc.subject | Germanium compounds | en_US |
dc.subject | Photons | en_US |
dc.subject | X ray detectors | en_US |
dc.subject | X ray photoelectron spectroscopy | en_US |
dc.subject | Characteristic x rays | en_US |
dc.subject | COMPTON | en_US |
dc.subject | Compton scattered photons | en_US |
dc.subject | Energy | en_US |
dc.subject | Energy depositions | en_US |
dc.subject | Energy source | en_US |
dc.subject | HPGe detectors | en_US |
dc.subject | Possible mechanisms | en_US |
dc.subject | Spectra's | en_US |
dc.subject | Spectral feature | en_US |
dc.subject | Photoelectrons | en_US |
dc.title | Photoelectron, Compton and characteristic x-ray escape from an HPGe Detector in the range 8-52 keV | en_US |
dc.type | Conference Object | en_US |
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