Use of Anionic Surfactant Sodium Lauryl Ether Sulfate as a Capping Agent in Metal-Chalcogenide PbS Thin Film Production

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dc.contributor.authorYucel, E.
dc.date.accessioned2024-09-18T21:00:20Z
dc.date.available2024-09-18T21:00:20Z
dc.date.issued2023
dc.departmentHatay Mustafa Kemal Üniversitesien_US
dc.description.abstractIn this paper, nanostructured semiconductor PbS metal-chalcogenide thin films were fabricated by the chemical bath deposition method in a surface active agent environment. The structural, morphologi-cal, and optical properties of PbS thin films were characterized by X-ray diffraction, scanning electron microscopy, scanning probe microscope and ultraviolet-visible spectroscopy analyses. These analyses reveal that surfactant sodium lauryl ether sulphate plays a key role in modifying the surface roughness and optical properties of PbS thin films. The average surface roughness decreased from 87.9 to 42.8 nm after adding sodium lauryl ether sulfate to the chemical bath solutions. With the increasing sodium lauryl ether sulfate content, the optical band gaps of the PbS thin films increased from 2.10 to 2.52 eV. Additionally, the optical transmittance value of the 3% sodium lauryl ether sulfate added sample in-creased by approximately 37% compared to the pure sample.en_US
dc.identifier.doi10.12693/APhysPolA.143.290
dc.identifier.issn0587-4246
dc.identifier.issn1898-794X
dc.identifier.issue4en_US
dc.identifier.scopus2-s2.0-85159581115en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.urihttps://doi.org/10.12693/APhysPolA.143.290
dc.identifier.urihttps://hdl.handle.net/20.500.12483/12602
dc.identifier.volume143en_US
dc.identifier.wosWOS:000996004000005en_US
dc.identifier.wosqualityQ4en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherPolish Acad Sciences Inst Physicsen_US
dc.relation.ispartofActa Physica Polonica Aen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjecttopicsen_US
dc.subjectPbSen_US
dc.subjectchemical bath depositionen_US
dc.subjectsurfactanten_US
dc.subjectsurface roughnessen_US
dc.titleUse of Anionic Surfactant Sodium Lauryl Ether Sulfate as a Capping Agent in Metal-Chalcogenide PbS Thin Film Productionen_US
dc.typeArticleen_US

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